Electron Energy-loss Spectroscopy in the Electron Microscope

Egerton, R. F.

The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.

EAN

9780306452239

Publisher

Plenum Publishing Co.,N.Y.

Published

31 May 1996

Pages

500